EPS Reference Time Actual Consensus Previous
2026-04-29 FY2026Q1 PM 0.56 0.32 0.23
2026-02-04 FY2025Q4 PM 0.46 0.35 0.27
2025-10-29 FY2025Q3 PM 0.33 0.34 0.35
2025-07-30 FY2025Q2 PM 0.27 0.30 0.25
2025-04-30 FY2025Q1 PM 0.23 0.33 0.18



Peers Price Chg Day Year Date
Advantest 31,200.00 -230.00 -0.73% 206.18% Jun/24
Axcelis Technologies 171.17 -12.75 -6.93% 145.79% Jun/23
Advanced Energy Industries 364.96 -23.27 -5.99% 175.42% Jun/23
Applied Materials 585.88 -54.30 -8.48% 225.16% Jun/23
Azenta 22.20 -0.07 -0.31% -26.27% Jun/23
Cohu 64.37 -5.70 -8.13% 227.25% Jun/23
Daqo New Energy 13.47 -0.43 -3.09% -3.02% Jun/23
Enphase Energy 47.22 -5.19 -9.90% 23.03% Jun/23
Entegris 168.22 -15.78 -8.58% 105.82% Jun/23
FormFactor 142.87 -13.79 -8.80% 314.48% Jun/23

Indexes Price Day Year Date
USND 25587 -579.56 -2.21% 28.50% Jun/23
US2000 2975 -28.92 -0.96% 37.68% Jun/23

FormFactor traded at $142.87 this Tuesday June 23rd, decreasing $13.79 or 8.80 percent since the previous trading session. Looking back, over the last four weeks, FormFactor lost 4.68 percent. Over the last 12 months, its price rose by 314.48 percent. Looking ahead, we forecast FormFactor to be priced at 146.47 by the end of this quarter and at 137.60 in one year, according to Trading Economics global macro models projections and analysts expectations.

FormFactor, Inc. is a provider of test and measurement technologies. The Company operates through two segments: Probe Cards segment and the Systems segment. Probe Cards segment consists of probe card products and analytical probes. The Systems segment consists of probe stations, metrology systems, and thermal and cryogenic systems. Its probe cards utilize a variety of technologies and product architectures, including micro-electromechanical systems (MEMS) technologies. Analytical probes are used for a diverse set of applications, including device characterization, electrical simulation model development, failure analysis, and prototype design debugging. Probe stations, also referred to as probing systems, are a critical tool for the development of semiconductor and electro-optical processes and designs. It offers surface metrology systems for various applications including the development, production, and quality control of semiconductor products.